The following is excerpted from a March 5, 2009 Rudolph Technologies press release:
Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, today announced a favorable verdict in its patent infringement suit against Israeli manufacturer, Camtek, Ltd., concerning Rudolph’s proprietary continuous scan wafer inspection technology.
The jury determined in its verdict that all models of Camtek's Falcon inspection system literally infringe Rudolph's US patent no. 6,826,298 for an Automated Wafer Defect Inspection System And A Process Of Performing Such Inspection which covers continuous inspection of wafers using strobing illumination. This is the technology that is used in August and Rudolph inspection tools. In awarding approximately $6.8M to Rudolph, the jury also rejected entirely Camtek's arguments that Rudolph's '6,298 patent is invalid.
Read the full press release here.
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